Instrumentation
The Center for Microscopic Imaging and Analysis (CMIA) houses a variety of imaging and analysis tools to provide a resource for not only our university, but also the community. St. Cloud State University’s CMIA allows for open access to some of today’s top microscopic imaging and analysis equipment.
Descriptions and Instructions
Atomic Force Microscope on an Inverted Florescent Optical Microscope
Model: Asylum Research MFP-3D Bio on top of a Nikon TE-2000
Capabilities: Height, Conductive, Magnetic and Fluorescent Data
Operations Manual: version 04.08 (18 mb)
Website: Asylum Research
X-ray Diffraction
Model: Brucker D8 Discover
Scanning Electron Microscope with X-ray Detector EDS system
The scanning electron microscope scans your sample with a beam of electrons to produce information about the sample's topography and composition.
Model: JEOL 6060LV with Thermo Fischer Sci Noran System Six EDS
Capabilities: Image and X-ray data
- About SEM (11 mb)
- SEM Basic Knowledge (1 mb)
- SEM Q & A (1 mb)
- Scanning Microscope Observation (1 mb)
Website: JEOL USA
Sputter Coater with Carbon Accessory for Thermal Deposition
The sputter coater uses a sputter deposition process to cover your specimen with a thin layer of gold, silver or gold palladium alloy to view it in the Scanning Electron Microscope.
Model: Denton Vacuum Desk IV
Capabilities: Gold, Silver, Gold Palladium targets with thickness monitor
Differential Scanning Calorimeter (DSC)
DSC is a thermoanalytical technique in which the difference in the amount of heat required to increase the temperature of a sample and reference is measured as a function of temperature.
Thermogravimetric Analyzer (TGA)
TGA is commonly used to determine selected characteristics of materials that exhibit either mass loss or gain due to decomposition, oxidation, or loss of volatiles (such as moisture).